JEOL Inspection Stage Chamber Assembly JWS-2000 Wafer Defect Review SEM Working
Inventory # CONF-1322
Installed Components
This JEOL Inspection Stage Chamber Assembly JWS-2000 Wafer Defect Review SEM is used working surplus. Removed from a JEOL JWS-2000 Wafer Defect Review SEM Scanning Electron Microscope System. The physical condition is good, but there are signs of previous use and handling.
Sale Details
- Item Condition: Used Working, 90 Day Warranty
- Estimated Packed Shipping Dimensions: L x W x H = 24"x24"x24" @ 90 lbs.; Requires Freight Shipping
- Only items pictured are included: If a part is not pictured, or mentioned above, then it is not included in the sale. Pictured test equipment is not included or available for sale.
- For items with multiple quantities: The pictured item is not necessarily the one that will be sent. Serial numbers or country of manufacture may vary.
- Items are sold with a 90-Day Satisfaction Guarantee
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