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JEOL PS UNIT(2) Power Supply Rack JWS-2000 Wafer Defect Review SEM Working Spare

JEOL PS UNIT(2) Power Supply Rack JWS-2000 Wafer Defect Review SEM Working Spare

JEOL PS UNIT(2) Power Supply Rack JWS-2000 Wafer Defect Review SEM Working Spare

Inventory # CONF-1161

  • Part No: PS UNIT(2)
  • Removed from a JEOL JWS-2000 Wafer Defect Review SEM Scanning Electron Microscope System

    Installed Power Supplies

  • Tamura Part No: OLD-12/15BBT
  • Tamura Part No: OLD-5AAVT
  • Tamura Part No: CSP100-5
  • Tamura Part No: CSP100-12

    This JEOL PS UNIT(2) Power Supply Rack JWS-2000 Wafer Defect Review SEM is used working surplus. Removed from a JEOL JWS-2000 Wafer Defect Review SEM Scanning Electron Microscope System. The physical condition is good, but there are signs of previous use and handling.

  • Sale Details

    • Item Condition: Used Working, 90 Day Warranty
    • Estimated Packed Shipping Dimensions: L x W x H = 20"x20"x20" @ 23 lbs.
    • Only items pictured are included: If a part is not pictured, or mentioned above, then it is not included in the sale. Pictured test equipment is not included or available for sale.
    • For items with multiple quantities: The pictured item is not necessarily the one that will be sent. Serial numbers or country of manufacture may vary.
    • Items are sold with a 90-Day Satisfaction Guarantee

      Lister 31


    Listed with ExportYourStore.com
    $182.76

    Original: $609.19

    -70%
    JEOL PS UNIT(2) Power Supply Rack JWS-2000 Wafer Defect Review SEM Working Spare

    $609.19

    $182.76
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    Description

    JEOL PS UNIT(2) Power Supply Rack JWS-2000 Wafer Defect Review SEM Working Spare

    Inventory # CONF-1161

  • Part No: PS UNIT(2)
  • Removed from a JEOL JWS-2000 Wafer Defect Review SEM Scanning Electron Microscope System

    Installed Power Supplies

  • Tamura Part No: OLD-12/15BBT
  • Tamura Part No: OLD-5AAVT
  • Tamura Part No: CSP100-5
  • Tamura Part No: CSP100-12

    This JEOL PS UNIT(2) Power Supply Rack JWS-2000 Wafer Defect Review SEM is used working surplus. Removed from a JEOL JWS-2000 Wafer Defect Review SEM Scanning Electron Microscope System. The physical condition is good, but there are signs of previous use and handling.

  • Sale Details

    • Item Condition: Used Working, 90 Day Warranty
    • Estimated Packed Shipping Dimensions: L x W x H = 20"x20"x20" @ 23 lbs.
    • Only items pictured are included: If a part is not pictured, or mentioned above, then it is not included in the sale. Pictured test equipment is not included or available for sale.
    • For items with multiple quantities: The pictured item is not necessarily the one that will be sent. Serial numbers or country of manufacture may vary.
    • Items are sold with a 90-Day Satisfaction Guarantee

      Lister 31


    Listed with ExportYourStore.com